隨手記錄

SOC/ANALOG TEST SYSTEM MODEL 3650-S2

Semiconductor manufacturing is a fast-moving industry. While devices become increasingly integrated and multifunctional, capital equipment must be built to endure

through several device generations and applications. With a variety of available options such as AD/DA converter test, ALPG for memory test, high voltage PE, multiple scan chain tests, and analog test, Chroma 3650-S2 provides wide coverage for different kinds of devices with flexible configurations. The system is especially suitable for testing power management chips and ICs. With its diverse offering of floating ground VI boards, HDDPS2, HVVI, PVI100, and MPVI, the 3650-S2 can cover high-precision, high-voltage, and high-current testing requirements.

The 3650-S2 tester's high throughput and high parallel test capabilities provide the most cost-effective solution for fabless, IDM, and testing houses. With a complete range of test functions, high accuracy, powerful software tools, and excellent reliability, Chroma 3650-S2 is the test solution for all your high- performance, microcontrollers, analog IC, consumer SoC devices, and wafer sort applications.

MODEL 3650-S2

KEY FEATURES

• 12 Universal slots for digital, analog and mixed-signal applications
• Up to 768 digital I/O and analog pins
• 50/100 MHz clock rate
• 100/200 Mbps (MUX) data rate
• Edge placement accuracy ±300ps
• 32 MW vector memory
• 32 MW pattern instruction memory
• Per-pin PPMU / frequency measurement
• Scan features to 2G depth per scan chain
• ALPG option for memory test
• Up to 48 high-voltage I/O pins
• Various floating ground VI resources
• 64-CH/board for HDDPS2 DPS option
• Max. 3000V (stacked) for HVVI analog option
• 8-CH AWG and 8-CH Digitizer ASO
• mixed-signal audio band test option
• 40A pulse at 60V for MPVI analog option
• 32-CH / board for V145 analog option
• 8-CH/board for PVI100 analog option
• Significantly increases LB component's area
• A larger power supply for the tester
• Microsoft Windows® 7 / Windows® 10
• C++ and GUI programming interface
• CRISP (full suite of intuitive software tools)
• Test program and pattern converters for other platforms
• Accepts DIB and probe card of other testers by adding a conversion kit
• Supports STDF data output
• Air-cooled, small footprint

* Specifications are subject to change without notice. Please visit our website for the most up-to-date specifications.