VLSI TEST SYSTEM MODEL 3380
To cope with the IC testing trend of high- speed, numerous pins, and integration of complicated functions in nowadays semiconductor industry, Chroma's 3380 VLSI Test Systems, the 3380D/3380P/3380 models, have adopted powerful functions according to different pin counts and parallel test ability, providing a complete test solution to fulfill customer's demands in cost and performance.
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexible architecture, and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-site test tendency. The embedded 1024 I/O pins is capable of testing 1024 ICs in parallel. In addition to supporting the unique 4-wire HD VI source ICs, the 3380 can also test Mini & Micro LED driver IC, CMOS image sensor(CIS), and 3D images through its adjustable structure, which covers a wide range of applications for IC testing.
The 3380 can bridge to 3380D(256 pins) /3380P(512 pins)for higher productivity requirements. Whether it is installation, stability, friendly user interface, or high cost/ performance ratio, the 3380 Series VLSI test systems have been widely proven and adopted by the Great China market.
APPLICATIONS
- MCU device
- ADC/DAC mixed-signal IC
- Logic IC
- ADDA
- ALPG
- Smart card
- CMOS image sensor (CIS)
- Power IC (Class D IC)
- Consumer IC
- LED driver IC
MODEL 3380
KEY FEATURES
- 50/100 MHz clock rate
- 50/100 Mbps data rate
- 1024 I/O pins (max. 1280 I/O pins)
- Up to 1024 sites of parallel testing
- 32/64/128M pattern memory
- 16M capture memory per pin
- Various VI source
- Flexible hardware architecture (interchangeable I/O, VI, ADDA,)
- Real parallel trim/match function
- Time and frequency measurement unit (TFMU)
- STDF tools support
- Test program/pattern converter (J750, D10, S50/100, E320, SC312, V7, TRI-6036, etc.)
- AD/DA test (16/24 bits option)
- SCAN test option (max. 2G bits/chain)
- ALPG test option for embedded memory
- CRAFT C/C++ programming language
- Software interface same as 3380P/3360P
- User-friendly Windows 7/Windows 10 environment
| Model | 3380 |
| Clock Rate | 50/100MHz |
| Data Rate | 50/100Mbps |
| I/O Channels | 1024 Pins (Max. 1280 Pins) |
| Pattern Memory | Standard：32M / 64M；Options：64M / 128M |
| Parallel Testing Capability | 1024 DUTs |
| EPA | ±500ps |
| Resource Per Pin Architecture | Yes |
| VI source | MXDPS; MXUVI/MXREF; MLDPS; MDDPS |
| PMU (± 48V, ± 100mA) | 32 channels |
| HV-Pins driver (+5.9V to +13.5V) | 4 channels per board |
| PPMU (-2V~+6V, ± 32 mA) | Per pin (FIMV/FVMI) |
| Programmable Active Load (± 12 mA) | Per pin |
| TFMU (Time/Freq Measure unit:Max 400Mhz) | Per pin |
| Free-run Clock (Max: 200Mhz) | Per pin |
| Windows Environment | Windows 7/Windows 10 |
| Programming Language | C\C++ |
| 3380 Test Options | |
| AD/DA Converter Test (MXAWI / MXAWI2) | 4 AWG / 4 DIG (16/24 bits) |
| MXUVI (DPS ±12V, ± 1A, CG max. ±4A) | 16 Channels/board |
| MXDPS (DPS-8V ~ +16V, ±2A) | 8 Channels/board |
| MXREF (DPS ±48V, ±250mA, CG max. ±1A) | 16 Channels/board |
| MLDPS (DPS +12V/500mA, ±6V/±1A, CG max. ±32A) | 32 Channels/board |
| MDDPS (DPS -6V~+18V, ±500mA~±125mA, CG max. ±32A) | 64 Channels/board |
| SCAN | 1G bits/ chain(max. 2G bits/chain optional) |
| ALPG Memory Test | 16X, 16Y, 16D /board |
| System and Dimension | |
| Power Consumption | Max. 8KVA |
| Test Head | W714 x D717 x H458mm (Max. 165Kg) |
| Main Frame | W766 x D700 x H1562mm (Max. 160Kg) |
* Note *1: "Direct-Mount" as Standard
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