隨手記錄

ASL3000 Tester - Terms and Acronyms

ASL3000 Tester 術語、字母縮寫

以下依照英文字母排列順序，將ASL3000 Tester 使用到的術語、字母縮寫記錄下來，借日後使用時可以查詢、參考。

■ ACM： Alternating Current Multiplexer

■ ACS： Alternating Current Source

■ ADC： Analog to Digital Convertor

■ ASB： Analog Switch Board

■ ATE： Automatic Test Equipment

■ AVD： Audio Video Digitizer (refer to mixed signal instruments).

■ AWG： Arbitrary Waveform Generator (refer to mixed signal instruments).

■ BB ACP： Baseband Analog Capture Port.

■ BB AWG： Baseband Arbitrary Waveform Generator

■ Brick： Term used to describe the RF module assembly, located in the ASL3000RF testhead.

■ C Bits： A group of 64 control lines available at the DUT fixture, for DUT fixture control.

■ Cal DUT： Testhead fixture used when running maintenance on the system. The Cal DUT is specific to the tester's configuration.

■ Checker： Program used to test basic functionality of ASL instruments.

■ CMOS： Complementary Metal Oxide Silicon - a process used to manufacture integrated circuits.

■ Comparator： MDI circuit used for "monitoring" the Output pin of the DUT.

■ Cycle： Term used to define the time of one test cycle in a digital functional test (refer to MDI).

■ DAC： Digital to Analog Convertor

■ DCC： Data Converter Card

■ DDD： Digital Driver and Detector

■ DLL： Dynamic Link Libraries

■ DOAL： Dual Op-Amp Loop

■ Down Convert： Term used for converting an RF frequency to an IF frequency.

■ DPS： DUT Power Supply

■ Driver： MDI circuit used for driving the Input pin of the DUT.

■ DSP： Digital Signal Processing

■ DUT Fixture： Circuit board that resides on top of the testhead and interfaces the DUT to the instrument cards (via pogo pins).

■ DUT Power： Power routed from testhead to DUT fixture (via pogos). Controlled by switch on side of testhead.

■ DUT： Device Under Test

■ DVI： Dual Voltage/Current Source

■ ECB： Etched Circuit Board

■ ECL： Emitter Coupled Logic - a very fast bipolar IC technology.

■ ESD： Electro-static Discharge

■ FPGA： Field Programmable Gate Array - a logic device that can be Alange programmed or re-programmed anytime.

■ FRU： Field Replaceable Unit

■ Functional Test： A digital test that runs a DUT through all possible logic conditions (refers to MDI).

■ G4  Receiver： Board within MVNA used for digitizing and analyzing (DSP) the RF measurements. (G4 is the DSP processor chip.)

■ GPIB： General Purpose Interface Bus

■ Head Power： Power routed from DC power supply (in rack) to testhead. Controlled by switch on the DC Power Supply in the rack.

■ HF： High Frequency

■ HVS： High Voltage Source

■ I/O： Input/Output

■ I/Q Generator： An AWG that outputs two signals, one in-phase (1)) and the other 90 degrees out of phase (Q). Used to modulate an RF source.

■ IC： Integrated Circuit

■ IF： Intermediate Frequency

■ Inhibit： A driver state or condition. When the driver is inhibited, it's out of the circuit via high impedance. Drivers are typically inhibited when the comparator is in use (refer to MDI).

■ Init： Initialize a program for the ASL tester, should be ran before running VATE.

■ LF： Low Frequency

■ LO： Local Oscillator (refer to RF subsystem)

■ LVDS： Low Voltage Differential Signals - high speed bus architecture utilizing low voltages and differential signals.

■ LZB： Link/Zener Blower

■ MCAL： Multical - program used to calibrate the RF subsystem within the ASL3000RF tester.

■ MDI： Modular Digital Instrument

■ Mixer： Circuit used to down convert an RF or IF frequency. Mixers output the sum and difference frequency of the two input fundamental frequencies.

■ Multi-site： More than one DUT site being tested for increased through put.

■ MUX： Resource Multiplexer

■ MVNA： Modulated Vector Network Analyzer

■ MVS： Medium Voltage Source

■ OFS： Octal Floating Source

■ On-the-fly： Ability to change parameters during a functional burst or test.

■ Op Amp： Operational Amplifier - a linear IC amplifier.

■ OVI： Octal Voltage/Current

■ PMU： Parametric Measurement Unit - a voltage/current meter typically with force voltage/current capability.

■ Ports： Term used for the RF input and/or output of the RF Subsystem.

■ PRO： Prototyping

■ PVI： Pulsed V/I

■ RCS： Ramp Current Source

■ RF： Radio Frequency

■ RFVT： RF Virtual Tester - Tool used for RF subsystem programming and debug.

■ TG： Timing Generator - typically associated with a digital subsystem.

■ TIA： Time Interval Analyzer

■ Timeset(s)： The timing parameters for both cycle time and driver/comparator edges. The Octet has 32 edge time sets and 16 cycle time sets.

■ TMU： Time Measurement Unit

■ Tri-state： A high impedance third logic state (ie high, low, and tri-state) for some devices.

■ TTL： Transistor-Transistor Logic - a bipolar process used to manufacture integrated circuits.

■ TØ： Represents time zero, denotes the start of each test cycle. All timing edges are with respect to Tø.

■ VATE： Visual ATE software environment for ASL tester. -

■ VLSI： Very Large Scale Integration.

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