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VLSI TEST SYSTEM MODEL 3380

To cope with the IC testing trend of high- speed, numerous pins, and integration of complicated functions in nowadays semiconductor industry, Chroma's 3380 VLSI Test Systems, the 3380D/3380P/3380 models, have adopted powerful functions according to different pin counts and parallel test ability, providing a complete test solution to fulfill customer's demands in cost and performance.

The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexible architecture, and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-site test tendency. The embedded 1024 I/O pins is capable of testing 1024 ICs in parallel. In addition to supporting the unique 4-wire HD VI source ICs, the 3380 can also test Mini & Micro LED driver IC, CMOS image sensor(CIS), and 3D images through its adjustable structure, which covers a wide range of applications for IC testing.

The 3380 can bridge to 3380D(256 pins) /3380P(512 pins)for higher productivity requirements. Whether it is installation, stability, friendly user interface, or high cost/ performance ratio, the 3380 Series VLSI test systems have been widely proven and adopted by the Great China market.

 

 

APPLICATIONS

  • MCU device
  • ADC/DAC mixed-signal IC
  • Logic IC
  • ADDA
  • ALPG
  • Smart card
  • CMOS image sensor (CIS)
  • Power IC (Class D IC)
  • Consumer IC
  • LED driver IC

 

 

 

MODEL 3380

KEY FEATURES

  • 50/100 MHz clock rate
  • 50/100 Mbps data rate
  • 1024 I/O pins (max. 1280 I/O pins)
  • Up to 1024 sites of parallel testing
  • 32/64/128M pattern memory
  • 16M capture memory per pin
  • Various VI source
  • Flexible hardware architecture (interchangeable I/O, VI, ADDA,)
  • Real parallel trim/match function
  • Time and frequency measurement unit (TFMU)
  • STDF tools support
  • Test program/pattern converter (J750, D10, S50/100, E320, SC312, V7, TRI-6036, etc.)
  • AD/DA test (16/24 bits option)
  • SCAN test option (max. 2G bits/chain)
  • ALPG test option for embedded memory
  • CRAFT C/C++ programming language
  • Software interface same as 3380P/3360P
  • User-friendly Windows 7/Windows 10 environment

 

 

SPECIFICATIONS
Model 3380
Clock Rate 50/100MHz
Data Rate 50/100Mbps
I/O Channels 1024 Pins (Max. 1280 Pins)
Pattern Memory Standard：32M / 64M；Options：64M / 128M
Parallel Testing Capability 1024 DUTs
EPA ±500ps
Resource Per Pin Architecture Yes
VI source MXDPS; MXUVI/MXREF; MLDPS; MDDPS
PMU (± 48V, ± 100mA) 32 channels
HV-Pins driver (+5.9V to +13.5V) 4 channels per board
PPMU (-2V~+6V, ± 32 mA) Per pin (FIMV/FVMI)
Programmable Active Load (± 12 mA) Per pin
TFMU (Time/Freq Measure unit:Max 400Mhz) Per pin
Free-run Clock (Max: 200Mhz) Per pin
Windows Environment Windows 7/Windows 10
Programming Language C\C++
3380 Test Options  
AD/DA Converter Test (MXAWI / MXAWI2) 4 AWG / 4 DIG (16/24 bits)
MXUVI (DPS ±12V, ± 1A, CG max. ±4A) 16 Channels/board
MXDPS (DPS-8V ~ +16V, ±2A) 8 Channels/board
MXREF (DPS ±48V, ±250mA, CG max. ±1A) 16 Channels/board
MLDPS (DPS +12V/500mA, ±6V/±1A, CG max. ±32A) 32 Channels/board
MDDPS (DPS -6V~+18V, ±500mA~±125mA, CG max. ±32A) 64 Channels/board
SCAN 1G bits/ chain(max. 2G bits/chain optional)
ALPG Memory Test 16X, 16Y, 16D /board
System and Dimension  
Power Consumption Max. 8KVA
Test Head W714 x D717 x H458mm (Max. 165Kg)
Main Frame W766 x D700 x H1562mm (Max. 160Kg)

* Note *1: "Direct-Mount" as Standard

 


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