隨手記錄

1. Overview of Test Program(測試程式概述)

1.1　總覽

1.2　程式的架構

2. Device Definition File

2.1　總覽

2.2　DEC_MODE

2.3　PIN_LIST 宣告

2.4　PIN_GROUP

2.5　UR_PIN_GROUP

2.6　POWER_PIN_GROUP

2.7　POWER_GANE_PIN_GROUP

2.8　TIME_NAME_DEF

2.9　LEVEL_NAME_DEF

3. Pattern Files

3.1　總覽

3.2　SET_DEC_FILE

3.3　HEADER

3.4　PATTERN

4. Plan Program

4.1　總覽

4.2　Basic Control Statement

4.3　MLDPSControl Statement

4.4　MLDPS High-Speed Function

4.5　MDDPS Control Statement

4.6　MXDPS Control Statement

4.7　MXUVI Control Statement

4.8　MXREF Control Statement

4.9　Complex Control Statement

4.10　MXPMU Control Statement

4.11　PPMU Control Statement

4.12　Input & Output Condition Setting

4.13　Relay Setting

4.14　Oscillator Function Test

4.15　TMU Control Statement

4.16　Function Test

4.17　SOCKET Control function

4.18　Measure Result Getting

4.19　SCAN Function (Option)

4.20　ALPG Function (Option)

4.21　AWG/Digitizer (Option)

4.22　Capture Memory

4.23　Shmoo statement

4.24　MAVI2 Generator / Digitizer

5. Plan Program of Extension

5.1　其它

5.2　CRAFT Macro定義

5.3　C Language Library

5.4　Gang-mode Function

5.5　PE HV Function

5.6　RF Subsystem(Option)